X-ray non-destructive Characterisation

X-ray gives access non-destructively to the internal structures of a material (composition, presence of defects…). Our research activities are concerned with non-destructive characterisation by x-ray imaging: prototype characterisation, defect detection, damage characterisation, and material characterisation in relation with the mechanical properties. The techniques commonly used are radiography, radioscopy and spectrometry.

General applications:

Evaluation of structure and population of defects in plant- and glass-fibre composites, in relation with the mechanical properties.

Online process control and detection of defects, i.e. in metallic materials.

Real-time process monitoring: development of techniques for intelligent manufacturing processes.

Characterisation of advanced ceramics

Radioscopic image of an electronic chip

Siden er opdateret 30.10.2007